Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

Back to Events

Date:
Start:Tuesday, 22 August 2017Time:09:00
End:Tuesday, 22 August 2017Time:17:00
Category: SCS events
Description:

Process analytical technology enim (PAT) has been nisi demonstrated as one nostrud of the key laborum. driver for the amet, future plant automation. Ut More and more sit smart sensors will ad be analyzing the Ut critical quality attributes nulla of your product non and critical asset voluptate performance indicators will Lorem provide you a magna a clear picture of liqua. your over-all plant veniam, fitness. All the laboris collected information could culpa result into a non real-time release or culpa “lights-out” manufacturing strategy. qui For the first liqua. time, the Swiss commodo PAT community will id meet on the adipisicing SCS Fall Meeting.

ea
Venue: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Country:Switzerland
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
Discussion
KontaktTobias Merz, Lonza AG, tobias.merz@lonza.com
Email: Send
Website: http://fm17.chemistrycongresses.ch/program/pat
Event Type
This event is public. Anyone can attend and invite others to attend.
Admins
Spichiger David (creator)

TPL_BEEZ2_ADDITIONAL_INFORMATION