Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

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Date:
Start:Tuesday, 22 August 2017Time:09:00
End:Tuesday, 22 August 2017Time:17:00
Category: SCS events
Description:

Process analytical technology proident, (PAT) has been laboris demonstrated as one veniam, of the key consectetur driver for the ut future plant automation. elit, More and more amet, smart sensors will reprehenderit be analyzing the consequat. critical quality attributes ullamco of your product dolor and critical asset labore performance indicators will magna a provide you a aliquip clear picture of anim your over-all plant deserunt fitness. All the in collected information could cillum result into a consequat. real-time release or est “lights-out” manufacturing strategy. labore For the first ea time, the Swiss velit PAT community will irure meet on the sit SCS Fall Meeting.

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Venue: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Country:Switzerland
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
Discussion
KontaktTobias Merz, Lonza AG, tobias.merz@lonza.com
Email: Send
Website: http://fm17.chemistrycongresses.ch/program/pat
Event Type
This event is public. Anyone can attend and invite others to attend.
Admins
Spichiger David (creator)

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