Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

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Date:
Start:Tuesday, 22 August 2017Time:09:00
End:Tuesday, 22 August 2017Time:17:00
Category: SCS events
Description:

Process analytical technology voluptate (PAT) has been aute demonstrated as one liqua. of the key laboris driver for the nulla future plant automation. Excepteur More and more ad smart sensors will cillum be analyzing the officia critical quality attributes consequat. of your product commodo and critical asset aute performance indicators will ullamco provide you a ad clear picture of in your over-all plant in fitness. All the qui collected information could cupidatat result into a commodo real-time release or adipisicing “lights-out” manufacturing strategy. laborum. For the first Ut time, the Swiss sunt PAT community will est meet on the occaecat SCS Fall Meeting.

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Venue: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Country:Switzerland
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
Discussion
KontaktTobias Merz, Lonza AG, tobias.merz@lonza.com
Email: Send
Website: http://fm17.chemistrycongresses.ch/program/pat
Event Type
This event is public. Anyone can attend and invite others to attend.
Admins
Spichiger David (creator)

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