Prof. Dr. Emmanuel Fort, Institut Langevin, ESPCI ParisTech, Université Paris Diderot, France

e field supercritical angle fluorescence microscopy for membrane imaging

Start Date	02.12.2010 - 10:15
Event End	02.12.2010 - 10:15
Location	Universität Zürich, Campus Irchel, Departement für Chemie

e field supercritical angle fluorescence microscopy for membrane imaging