Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

zurück zu Veranstaltungen

Datum:
Start:Dienstag, 22 August 2017Zeit:09:00
Ende:Dienstag, 22 August 2017Zeit:17:00
Kategorie: SCS events
Beschreibung:

Process analytical technology officia (PAT) has been eiusmod demonstrated as one esse of the key commodo driver for the minim future plant automation. nulla More and more do smart sensors will dolor be analyzing the fugiat critical quality attributes dolor of your product consequat. and critical asset veniam, performance indicators will aute provide you a Ut clear picture of nulla your over-all plant ad fitness. All the labore collected information could pariatur. result into a pariatur. real-time release or quis “lights-out” manufacturing strategy. eiusmod For the first deserunt time, the Swiss tempor PAT community will dolor meet on the SCS Fall Meeting.

sint
Ort: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Land:Switzerland
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
Discussion
KontaktTobias Merz, Lonza AG, tobias.merz@lonza.com
Email: Senden
Webseite: http://fm17.chemistrycongresses.ch/program/pat
Veranstaltungsart
Die Veranstaltung ist öffentlich. jeder kann daran Teilnehmen und andere dafür einladen.
Adminstrator
Spichiger David (Ersteller)

TPL_BEEZ2_ADDITIONAL_INFORMATION