Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

zurück zu Veranstaltungen

Start:Dienstag, 22 August 2017Zeit:09:00
Ende:Dienstag, 22 August 2017Zeit:17:00
Kategorie: SCS events

Process analytical technology laborum. (PAT) has been ut demonstrated as one velit of the key dolor driver for the eiusmod future plant automation. voluptate More and more dolor smart sensors will exercitation be analyzing the veniam, critical quality attributes et of your product and critical asset aliquip performance indicators will nulla provide you a occaecat clear picture of adipisicing your over-all plant Ut fitness. All the consequat. collected information could fugiat result into a ullamco real-time release or in “lights-out” manufacturing strategy. amet, For the first Excepteur time, the Swiss ut PAT community will nulla meet on the quis SCS Fall Meeting.

Ort: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
KontaktTobias Merz, Lonza AG,
Email: Senden
Die Veranstaltung ist öffentlich. jeder kann daran Teilnehmen und andere dafür einladen.
Spichiger David (Ersteller)