Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

zurück zu Veranstaltungen

Start:Dienstag, 22 August 2017Zeit:09:00
Ende:Dienstag, 22 August 2017Zeit:17:00
Kategorie: SCS events

Process analytical technology consequat. (PAT) has been consectetur demonstrated as one Duis of the key proident, driver for the laborum. future plant automation. reprehenderit More and more exercitation smart sensors will labore be analyzing the laboris critical quality attributes liqua. of your product tempor and critical asset aliquip performance indicators will consequat. provide you a commodo clear picture of enim your over-all plant exercitation fitness. All the fugiat collected information could esse result into a ad real-time release or “lights-out” manufacturing strategy. cupidatat For the first ullamco time, the Swiss irure PAT community will laborum. meet on the dolor SCS Fall Meeting.

Ort: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
KontaktTobias Merz, Lonza AG,
Email: Senden
Die Veranstaltung ist öffentlich. jeder kann daran Teilnehmen und andere dafür einladen.
Spichiger David (Ersteller)