Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

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Date:
Start:Tuesday, 22 August 2017Time:09:00
End:Tuesday, 22 August 2017Time:17:00
Category: SCS events
Description:

Process analytical technology cupidatat (PAT) has been consequat. demonstrated as one qui of the key et driver for the qui future plant automation. veniam, More and more eu smart sensors will quis be analyzing the ut critical quality attributes liqua. of your product velit and critical asset sit performance indicators will et provide you a Lorem clear picture of in your over-all plant nisi fitness. All the minim collected information could ad result into a fugiat real-time release or nulla “lights-out” manufacturing strategy. ea For the first adipisicing time, the Swiss ex PAT community will occaecat meet on the ipsum SCS Fall Meeting.

reprehenderit
Venue: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Country:Switzerland
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
Discussion
KontaktTobias Merz, Lonza AG, tobias.merz@lonza.com
Email: Send
Website: http://fm17.chemistrycongresses.ch/program/pat
Event Type
This event is public. Anyone can attend and invite others to attend.
Admins
Spichiger David (creator)

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