Symposium on PAT & Industry 4.0 2017-08-22 09:00:00

Back to Events

Date:
Start:Tuesday, 22 August 2017Time:09:00
End:Tuesday, 22 August 2017Time:17:00
Category: SCS events
Description:

Process analytical technology sit (PAT) has been nulla demonstrated as one anim of the key Duis driver for the dolore future plant automation. ad More and more dolore smart sensors will commodo be analyzing the quis critical quality attributes ut of your product proident, and critical asset laboris performance indicators will cupidatat provide you a fugiat clear picture of fugiat your over-all plant consectetur fitness. All the labore collected information could commodo result into a sed real-time release or aute “lights-out” manufacturing strategy. mollit For the first sint time, the Swiss sed PAT community will dolore meet on the in SCS Fall Meeting.

velit
Venue: University of Bern, VonRoll Areal
Fabrikstrasse 8, 3012, Bern
Country:Switzerland
Detailed DescriptionMorning Session:
«Sensor Roadmap 4.0 – Prospects towards a uniform topology for process control and smart sensor networks», Dr. Michael Maiwald, Bundesanstalt für Materialforschung und -prüfung (BAM)
«Machine Learning and Chemometrics: A contradictive approach or a good complement», Dr. Frank Westad, CAMO
«Challenges in data management for biopharmaceutical productions», Dr. Helge Engelking, Lonza Ltd.

Afternoon Session
«From process understanding to manufacturing process control with PAT», Dr. Christian Lautz, Roche
«Real-time Insights: Inline Raman monitoring of distillation columns», Dr. Clemens Minnich, S-PACT
«Online Proton-transfer-reaction and Resonance-enhanced multiphoton ionization mass spectrometry for monitoring the coffee roast process.», Dr. Sebastian Opitz, ZHAW
Discussion
KontaktTobias Merz, Lonza AG, tobias.merz@lonza.com
Email: Send
Website: http://fm17.chemistrycongresses.ch/program/pat
Event Type
This event is public. Anyone can attend and invite others to attend.
Admins
Spichiger David (creator)

TPL_BEEZ2_ADDITIONAL_INFORMATION