Prof. Keith A. Earle, SUNY University at Albany and ACERT Cornell University, USA
| Start Date | 16.11.2010 - 16:45 |
| Event End | 16.11.2010 - 16:45 |
| Location | ETH Zürich, Hönggerberg |
ameter Sensitivity and Magnetic Resonance Spectra: A Toolkit for Experimental Design and Analysis