Prof. Dr. Emmanuel Fort, Institut Langevin, ESPCI ParisTech, Université Paris Diderot, France

e field supercritical angle fluorescence microscopy for membrane imaging
Start Date 02.12.2010 - 10:15
Event End 02.12.2010 - 10:15
Location Universität Zürich, Campus Irchel, Departement für Chemie
e field supercritical angle fluorescence microscopy for membrane imaging